PhD Position in Computational Imaging: This scholarship will support a PhD position focused on developing advanced diffractive imaging techniques in scanning electron microscopy (SEM) for improved inspection and metrology in semiconductor devices. The position is part of a collaborative research effort aimed at marrying computational imaging with electron microscopy, situated in a dynamic, interdisciplinary environment.
Designation
PhD Candidate
Research Area
- Electron Microscopy
- Computational Imaging
- Applied Physics
- Materials Science
Location
Delft University of Technology, Delft, Netherlands
Eligibility/Qualification
- Master’s degree (or nearing completion) in Physics, Mathematics, Materials Science, Electrical Engineering, or a closely related field.
- Excellent spoken and written English communication skills.
- Interest in both theoretical and hands-on experimental work, including instrument development.
- Experience with electron microscopy, quantitative data analysis, and/or numerical modeling is a plus.
- Candidates from underrepresented backgrounds in academia are particularly encouraged to apply.
Description
As semiconductor devices become smaller, the challenges related to spatial resolution and sample compatibility grow ever more complex. This project seeks to leverage novel computational diffractive imaging techniques to enhance the capabilities of SEM, particularly at lower accelerating voltages. The successful candidate will engage in cutting-edge research involving numerical simulations, image formation, and model-based reconstruction algorithms. This role is situated in the Department of Imaging Physics, under the guidance of Prof. Georgios Varnavides, and offers a supportive, multidisciplinary research environment.
How to Apply
Interested candidates must submit their application no later than 15 August 2025 through the university’s online application portal. Required documents include:
- A detailed CV.
- A cover letter detailing research background, interest in the position, and fit within the group.
- Names and email addresses of at least 2 references, with explanations of their relevance.
Last Date for Apply
15 August 2025
This scholarship represents a significant opportunity for candidates eager to develop their research skills in a collaborative and innovative field, contributing to the advancement of technology in semiconductor inspection.
