PhD Position on Hybrid X-Ray Metrology: The University of Twente is seeking a motivated PhD student for a groundbreaking research project focused on multilayer growth optimization through hybrid X-ray metrology. This project aims to innovate and enhance measurement techniques for nanoscale multilayer structures crucial in various advanced technology fields such as optics, photovoltaics, and wear resistance.
PhD Position on Multilayer Growth Optimization by Hybrid X-Ray Metrology (MOXY)
Designation
PhD Candidate in Multilayer Growth Optimization
Table
| Detail | Information |
|---|---|
| Research Area | Multilayer Growth Optimization and Metrology |
| Location | University of Twente, Netherlands |
| Eligibility/Qualification | Master’s degree in solid state physics, materials science, computational physics, or a related field. Experience in thin film deposition or metrology and proficiency in data analysis (Matlab/Python) is preferred. |
| Salary | Gross monthly salary: €2,901 – €3,707 (based on experience) |
| Hours | 38-40 hours per week |
| Deadline for Application | 15 September 2025 |
Research Area
Focus on hybrid metrology for multilayered structures, utilizing non-destructive X-ray based techniques (XRD, XRR, XRF) to improve the understanding and performance of nanometer-thin films.
Location
University of Twente, Enschede, Netherlands
Eligibility/Qualification
- A Master’s degree in solid state physics, materials science, computational physics, or a related field.
- Early experience in thin film deposition and/or thin film metrology is advantageous.
- Experience with data analysis tools such as Matlab or Python.
- Strong ability to work both independently and collaboratively.
- Good communication skills in English are essential.
Description
You will be part of a multidisciplinary team at the XUV Optics group, engaged in developing an in-house X-ray metrology platform to analyze multilayer mirrors. Your tasks will include:
- Integrating measurement procedures and data analysis.
- Collaborating with industrial partners to address challenges in thin film analysis.
- Working towards advancements in metrology that can surpass current analytical limitations.
How to Apply
Interested candidates should submit an application package that includes:
- A motivation letter detailing specific interests and motivations.
- A detailed CV.
- A publication list and academic transcripts.
- Contact details of referees.
Applications should be submitted through the University of Twente’s official website.
Last Date for Apply
15 September 2025
For more information or to reach out to the relevant contact regarding this opportunity, please refer to the official University of Twente website or contact Robbert van de Kruijs at r.w.e.vandekruijs@utwente.nl.
